Research on Experiment Technology for High Reliability Flash Storage Systems
Abstract
Mass Memory Units (MMU) of satellites are constantly evolving, big data technology are being applied to get performant mission-critical space storage systems. This paper aims to contribute in designing a high reliable MMU by applying RAID techniques at chip-level of SSDs. Tests using DiskSim simulator with SSD extension shows that RAID with variable strip size gives better results than traditional RAID in terms of reliability. Thus, this paper provides an important contribution toward designing a performant MMU.
Keywords
RAID, NAND flash, Reliability, SSD.
DOI
10.12783/dtcse/cimns2017/17411
10.12783/dtcse/cimns2017/17411
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