A Simple Physics-Based Bidirectional Effect Correction Method for Multiple-Flightline Aerial Photographs

Abstract

In this paper, a simple physics-based bidirectional effect correction method is developed for multiple-flightline aerial photographs. This novel method includes three steps. First, the local correction factors for each flightline were derived based on original observed reflectance and Ross-Li model; secondly, the global correction factors for all flightlines were derived based on simulated directional-to-nadir reflectance and Ross-Li model; finally, nadir view BRDF-adjusted reflectance from multiple-flightline for fixed illumination condition of ‘base flightline’ was produced using the combination of the two correction factors. The resulted show that the bidirectional effects within a given flightline and between flightlines were effectively normalized.