The Test Methods for Temperature Rises and Low-power Circuit

Cheng-bo LIANG, Jie YAN, Bei-bei XU

Abstract


Determination of low-power circuit and the selection of test methods of temperature rises are difficult points in testing of electric toys. This paper focuses on these issues.

Keywords


Electric toys, Temperature rises, Low-power circuit, Testing


DOI
10.12783/dtetr/ameme2017/16188

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