Impacts on the Ratio of Peak to Total and Peak to Source for Si-PIN Detector Through the Monte Carlo Method in XRF Analysis | Hefan-LIU | DEStech Transactions on Engineering and Technology Research

Impacts on the Ratio of Peak to Total and Peak to Source for Si-PIN Detector Through the Monte Carlo Method in XRF Analysis

Â Hefan-LIU, Â Ye-DENG, Â Xiang-HU, Â Xiaoling-ZHOU, Â Keyin-WU

Abstract

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DOI
10.12783/dtetr/apop2017/18714

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