Life Prediction of Electronic Products Based on Failure of Physics and Pseudo-Failure Data

Abstract

Aiming at the shortcomings of the traditional reliability evaluation of electronic products, a life prediction method of electronic products was proposed which was based on the failure of physics and pseudo-failure data. First of all, based on the failure mode, failure mechanism analysis of electronic products, the sensitive performance parameters of the product was determined; then by monitoring the degradation amount of sensitive parameters, the model of electronics degradation path was built, and maximum likelihood method was used to estimate its parameters; finally, by setting the fault threshold value, the life distribution of electronic products was gained. Simulation showed that the evaluation accuracy of the method is higher and providing a new way to evaluate the reliability of electronic products.