Metallographic Identification on the Fracture of Transformer Copper Conductor

Dong-yun SHI, Hao-yang DU, Qing-shan XU, Jian-long WANG, Xin WANG, Wei-ping MA, Ai-jun ZHU, Zhen-an REN

Abstract


Microstructures of the fractured transformer conductor features the mechanism of the failure. The difference of the microstructures in different part of the fractured conductor can be identified by macro and metallographic analyses. The macro morphologies, grain size, twins and sub grain boundaries are described as parameters for the qualitative analysis of the fracture of the conductor.

Keywords


Copper conductor, Metallographic analysis, Grain size, Secondary short-circuit melted fracture


DOI
10.12783/dtetr/icmme2017/9139

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