An Optimal Method of Test Point and Frequency Based on Global Sensitivity for Circuit Fault Diagnosis

Abstract

An optimal method of selecting test point and test frequency based on global sensitivity is proposed to overcome the problems of sub-network fault diagnosis for analog circuit. Parametric plotter is used with Pspice to avoid circuit topology analysis and tedious calculation process with time saving. Considering the parameters influencing element, the concept of global sensitivity of the network is defined, and as a basis to compare fault diagnosis capabilities of test points in different frequencies, optimal test point and test frequency is selected. Finally, an example is given to show efficiency of the method. Experimental results show that the new method improve the efficiency of diagnosis identify.