Efficient Processing of Data Acquired Using Microscopy Techniques

Abstract

This article focuses on processing of data acquired by the atomic force microscopy (AFM) method using tools of MATLAB programming language. The basic examples are presented as codes for two-dimensional (2D) and three-dimensional (3D) images of surface microstructure, heights histograms and S parameters. Furthermore, these examples can be applied to other scanning probe microscopy methods. The advantage of such processing over the software which is supplied to the microscope is complete freedom to work with the obtained data.