Evaluation of Surface Characteristics of Highly Oriented Pyrolitic Graphite
Abstract
Thanks to several outstanding optical and electrical qualities highly oriented pyrolitic graphite (HOPG) is considered a promising material in nanostructures preparation process. It has been successfully employed in scanning probe microscopy technique as a material for calibration. This work characterizes the surfaces of graphite that went through a mechanical processing and their following usage as substrates for obtaining semiconducting thin films by deposition
Keywords
Atomic force microscopy, Highly oriented pyrolitic graphite (HOPG), Surface microtexture
DOI
10.12783/dtssehs/amse2018/24828
10.12783/dtssehs/amse2018/24828