Evaluation of Surface Characteristics of Highly Oriented Pyrolitic Graphite

Stefan TALU, Rashid DALLAEV, Dinara SOBOLA

Abstract


Thanks to several outstanding optical and electrical qualities highly oriented pyrolitic graphite (HOPG) is considered a promising material in nanostructures preparation process. It has been successfully employed in scanning probe microscopy technique as a material for calibration. This work characterizes the surfaces of graphite that went through a mechanical processing and their following usage as substrates for obtaining semiconducting thin films by deposition

Keywords


Atomic force microscopy, Highly oriented pyrolitic graphite (HOPG), Surface microtexture


DOI
10.12783/dtssehs/amse2018/24828